| 01.00 |
Instrumentation and Experimental Techniques |
| 01 |
Conventional sources of X-rays |
| 02 |
Synchrotron radiation I - instrumentation / techniques |
| 03 |
Synchrotron radiation II - applications |
| 04 |
New X-ray sources |
| 05 |
Electron diffraction (LEED, RHEED, PED, AED) |
| 06 |
Cryo-electron microscopy |
| 07 |
X-ray imaging |
| 08 |
Neutron scattering I - techniques / instrumentation |
| 09 |
Neutron scattering II - applications |
| 10 |
Area detectors (multi-wire, image plate, CCD) |
| 11 |
Data accuracy and detectors |
| 12 |
Cryo-crystallography - techniques / instrumentation |
| 13 |
Fast (pico-second) crystallography |
| 14 |
Free electron lasers for X-rays |
| 02.00 |
Methods for Structure Determination |
| 01 |
Difficult structures |
| 02 |
Direct methods of phase determination |
| 03 |
Maximum entropy |
| 04 |
Anomalous dispersion / MAD / MIR phasing |
| 05 |
Laue / time resolved methods |
| 06 |
Incommensurate structure solution |
| 07 |
EXAFS / XANES |
| 08 |
High resolution NMR and macromolecules |
| 09 |
Liquid structure determination |
| 10 |
Structure prediction / computational methods |
|
Ab initio powder diffraction solutions |
| 11 |
- Molecular compounds |
| 12 |
- Inorganic compounds |
| 13 |
- Electron diffraction |
| 14 |
Ab initio low resolution (macromolecular) phasing |
| 15 |
X-ray and neutron complementarity |
| 16 |
Rietveld refinement methods |
